PRINCIPLE OF SUPER POSITION If two or more than two waves superimpose each other at a common particle of the medium then the resultant displacement ¥ of the particle is equal to the vector sum of the displacements (Vj; and 2) produced by individual waves. yaMtye2 Interference of Light Interference is the phenomenon in which two waves superpose to form the resultant wave of the lower, higher or same amplitude. The following are the types of light interference: 1. Constructive interference 2. Destructive interference Examples of interference of light. * Soap Bubble which reflects spectrum of light Floating film of oil on water Coherent sources Coherent sources are the sources of light which emits continuous light waves with same wavelength, frequency and having @ constant phase difference. ‘Waves are meeting ata point in same phase te. ‘Waves are meeting ata point with ot of paseResultant amplitude and intensity Ifwe have two waves y,=a,sinot and y,~a,sin(ot+}) where a,,a,= Individual amplitudes, 6= Phase difference between the waves at an instant when they are meeting a point. 1, and I, = Intensities of Individual waves. Resultant amplitude: After superimposition of the given waves resultant amplitude (or the amplitude of resultant wave) is given by A=a,’+a,"+2a,a,cosp For the interfering waves y,=asinotand y,=a,sin(ot+)), Phase difference between them is 90° . So resultant amplitude A=fa,"+a, Resultant _ intensity: As we know intensity a( Amplitude)’ => 1,-ka,’,I,-ka,” and I=-kA*(k is a proportionality constant) . Hence from the formula of resultant amplitude, we get the following formula of resultant intensity 11,+1,+2 JT, cosb The term 2/1,1,cosp is called interference term. For incoherent interference this term is zero so resultant intensity I=I,+1, .ference between Constructive and Destructive interference Constructive interference Destructive interference Consirctive interference i obtained a ‘point when the waves meets at that with same phase, (Le. maxionm Tish {Detintion) ‘Destructive interference is obtained at ‘that point when the wave meets at that point with opposite phase, (ie minimum light) (Definition) Phase difference between the waves at the point of observation =0° or 2nm. $= 180" oF (2n—1)min=1.2. or(2n-+i)n 0.1.2 Path difference between the waves at the point of observation A=W. (Le. cnet) (enn) Cie odd sultipeof = ) Resulant ampli atthe point of observation willbe maximum if =, AO HAy8, Aaa ‘Resultant amplitude atthe point of ‘observation willbe minimum AnanA-8 Ay ‘Resultant intensity atthe point of ‘observation will be maximum ‘Resultant intensity atthe point of ‘observation willbe minimum 1ensh 2th,Intereference: Resultant intensity due to two identical waves “The resultant intensity for two coherent sources is given by [=I +1, +21, cos For identical source |, telat 2fFTgcosd=Atgcos!® sis [ied -2ea] NOTE - > Redistribution of energy takes place in the form of maxima and minima in interference > avenge tery: ya tantln eteava! (Proportonality constant K=2)YOUNG'S DOUBLE SLIT EXPERIMENT (YDSE) ‘An interference pattern is obtained on the sereen when monochromatic light (single wavelength) falls on two narrow slits S, and S, which are very close together acts as two coherent sources, and when waves coming from these two sources superimposes on each other. Alternate bright and dark bands obtained on the sereen in this experiment. Scat ge ‘ These bands are called Fringes. Coe d= Distance between slits. = Distance between slits and screen ‘A= Wavelength of monochromatic light emitted from source OBSERVATIONS of YOUNG'S DOUBLE SLIT EXPERIMENT. 1) _Atcentral position ® = 0 or A= 0 So, Central fringe will be always bright. 2) The fringe patter formed by slit willbe brighter than that due toa point 3) The minima will nt be complete dark ifthe slit widths are unequal. So, uniform illumination occurs for very large width 4) No interference patter is observed on the sereen if one siti illuminated with red light and the other is iluminated with blue light, '5) The central fringe will be dark instead of bright ifthe two coherent sourees consist of object and its reflected image. For maxima atP: x=nh Where n =0,4112,.. . And for minima atP: x = 28—1)% Where n=0,+1,42,, Every fringes will have equal with, Width ofone fringe is = 22 and angular finge width 0 =DIFFRACTION OF LIGHT. The phenomenon of light bending around the corners of an obstacle/aperture whose size is comparable to the size of the wavelength of light. ‘Types of diffraction i ‘The diffraction phenomenon of light is divided into two types Fresnel diffraction Tn Fresnel’s diffraction, either source or screen or both are at finite distance from the diffracting device (obstacle or aperture). Common examples Diffraction ata straight edge narrow ‘wire or small opaque dise ete. Fraunhofer diff Tm this ease both source and screen are effectively at infinite distance from the diffracting device ‘Common examples: Difiraction at single slit, double slit and diffraction grating. sereenDiffraction of light at a single slit In case of diffraction at a single slit, we get a central bright band with alternate bright (maxima) and dark (minima) bands of decreasing intensity as shown 2D a AD and angular width =2* é aw (Width of ceneal maxima (i) The path difference between the waves from the two ends of the aperture is sven by where n=1,23,..i€ dsind=nh as the minima oceurs at point on either side ofthe central maxima (Gil) The secondary maxima occurs, where the path difference between the waves fom the wont he apse penby (21); whe W123 ce dsind(20e1)* (Gari‘Comparison between interference and difraction Interference Ditteaction Produced by the superimposition of | Produced by the superposition of waves fom wo cobeen souce, welt fom lent parts of ‘sane wave front (single coherent sey) All ings ae of he same with a» “T All ings have equal etsy ‘All secondary finges are of same ‘eit tthe central nim as ouble the wid nest ofall minima may be 2, Postion of a main and minima. ae Keu-tani) 2 Path iterence orn maxima oo A=. or 2 secondary main cnPOLARIZATION OF LIGHT Polarization describes the electric field oscillations of Light. Unpolarized tight Light with electric field oscillations in every directions in the plane perpendicular 1 the propagation of itis called Unpolarised light. Plane Potaiced tight Plane polarized ight isthe ight with ssilatons ony in one plane i * Tae 1 Plane of silation ithe plan in which seit cers nthe pared ih 2. Plane of polarization is the plane perpendicular to the plane of oscillation 5.By taunting through conan cals such as tourmaline or old ight can be polarized, [rast [seen Polarization by of Light Scattering Polarization of Light by Reflection When unpolarized light is scattered by small | Ifunpolarized light is reflected using @ surface, the reflected light can be obtained as particles with size equivalent to wavelength , the | completely polarised, partially polarized or unpolarized. The nature of reflected light scattered light isin the direction perpendicular | depends on the angle of incidence. to the incid ¢ direction is polarized light. a ‘When unpolarized light falls on an interface, the [wapusas neji reflected light is completely polarized if the angle | '2 of incidence isa specific angle called the ccarenen J, Brewster's angle (8,) “y Inthis condi x Reflected and Refracted rays are perpendicular to each other Also H= tan, — Brewster's lawPolaroid A Polaroid only allows light oscillations which are parallel to the transmission axis to pass through them. It is based on the principle of selective absorption. .. Polarizer and Alalvzer Polarizer (P) is the crystal or Polaroid on which unpolarised light is incident. Analyzer (A) is the crystal or Polaroid on which polarised light is incident. Malus law ‘The intensity of a polarised light passed through an analyser will change as the square of the cosine of the angle between the plane of transmission of the analyser and the plane of the polariser. This is known as Malus law. 1£0-90°,1-0,A-0 acta. it @--Reflection of Light Incident ray Nf Reftected ray When a ray of light approaches a smooth polished surface and the light ray bounces back, itis called the reflection of light, The three laws of reflection are ‘L.The angle between the incident ray and the normal is equal to the angle between the reflected ray and the normal 2.The incident ray, the normal and the reflected ray are all in the same plane 3. Incident ray and refracted ray are on different sides of the normal ‘Angie of { Angle of (eedence {reflection Micro reaction Refractive index The ratio of the velocity of light in a vacuum to its velocity in a specified medium is called Refractive index. c be This is a unitless quantity. Hatr Speed of lightwarer > Speed of lightyigss >Refraction of Light ‘When a Light Ray travels from one medium to another medium The Snell's law of refraction states thé The incident ray, the refracted ray and the normal at the point of incidence, all lie in the same plane. The ratio of the sine of the angle of incidence to the sine of the angle of refraction is constant for the pair of the given media. bz _ Sin) i Sin(r) Where ny and nz are refractive indexes of medium 1 and medium 2 respectively NOTE > When light raves from a denser medium to a rarer medium, bends away from the normal ‘+ When light travels from a rarer medium to a denser medium, it bends away from the normal Diagram showing the refraction ofa fom Glssto Ar me ae" % | Teen Diagram showing the refraction flight from Alrto glass Ss | 7 & rire)‘Total internal reflection of light Total internal reflection is a phenomenon of reflection of ray back to the same medium when passing from denser medium to rarer medium in a such away that angle of incidence greater than its critical angle, Critical Angle The critical angle is defined as the angle of incidence that provides an angle of refraction of 90-degrees. ‘Total in reflection cities angle Sin(®c) a