Revised USPSystem Suitability Parameters
Revised USPSystem Suitability Parameters
February 6 - 7, 2008
Hyderabad International Convention Center
Hyderabad, India
Repeatability
Capacity factor (k’) N ⎛ α − 1 ⎞⎛ 1 + kb' ⎞
Rs =
⎜ ⎟⎜ ⎟
Resolution 4 ⎝ α ⎠⎝ kb' ⎠
Tailing factor at W0.05 Efficiency Selectivity Retentivity
Theoretical plates (N)
Repeatability
USP:
Data from five replicate injections of the analyte are used to
calculate the relative standard deviation if the requirement is
2.0% or less.
Data from six replicate injections are used if the relative
standard deviation requirement is more than 2.0%
EP:
tr − tm
k'=
tm
8
Resolution
2(t 2 − t1 )
R=
W2 + W1
( a + b)
USP/EP Tailing Factor: T=
2a
a b 5 % of Peak Height
10
Relative Retention Times
l2d22
F2 = F1 2
l1d1
2
t
N= f r
2
w 1
0.9
0.8
0.7
0.6
0.5
0.4
0.3
0.2
f 0.1 t
-3 -2 -1
0 0 1 2 3
-0.1
w =2.355σ
w =4 σ