Datoteka:AFMsetup.jpg
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Datum/vrijeme | Smanjeni pregled | Dimenzije | Korisnik | Komentar | |
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trenutno | 16:10, 21 novembar 2006 | 721 × 569 (86 KB) | KristianMolhave | *Figure Caption: Typical AFM setup. The deflection of a microfabricated cantilever with a sharp tip is measured be reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample. *This illustration was made |
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